Chip bugs can lead to major security disasters

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Chip bugs

Shamir suggests that it's impractical to test all cases of 64*64-bit multiplication. But given the lifespan of a chip design, and given that the test only needs to be run once, wouldn't it be practical to design a "grid" or "distributed" test, after the style of the SETI search? A result in a year or so of testing would probably be acceptably useful. I may have my numbers wrong, of course.

Posted by: Martin.Taylor@...   Posted on: 11/19/07 You are currently: a Guest | Members login | Terms of Use

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